Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA

Abstract We focuse on issues related to degradation of FPGAs which has become dominant due to scaling and quantitatively estimate the degradation of FPGAs by NBTI. We map ring oscillators on the Cyclone II FPGAs and measure the variation of oscillation frequency. In the result, the variation of oscillation frequency is 5.97%. As for degradation of FPGAs, we measure the variation of oscillation frequency until 10,000 seconds passed at room temperature (28 degrees), 80 degrees or 100 degrees. As the result, degradation of oscillation frequency increases as temperature became higher and degradation of about 0.1% at 10,000 seconds was observed at high temperature.